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Method of lifetime estimation of EcoGaNTM in soft-switching operations

Published by ROHM

The whitepaper "Method of Lifetime Estimation of EcoGaN™ in Soft-Switching Operations" by ROHM details the failure mechanisms and reliability testing of GaN HEMTs (Gallium Nitride High Electron Mobility Transistors) in soft-switching applications. It explains the evaluation methods, including Dynamic High Temperature Operating Life (DHTOL) and Switching Accelerated Life Test (SALT), for estimating the lifetime of GaN HEMTs. The paper emphasizes the importance of GaN HEMTs in achieving high efficiency and reliability in power conversion systems, crucial for electronics professionals designing advanced semiconductor applications.

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